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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Alberto Bosio 2010 edition
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Alberto Bosio
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.
171 pages, 22 black & white tables, biography
| Media | Böcker Pocketbok (Bok med mjukt omslag och limmad rygg) |
| Releasedatum | 3 september 2014 |
| ISBN13 | 9781489983145 |
| Utgivare | Springer-Verlag New York Inc. |
| Antal sidor | 171 |
| Mått | 155 × 235 × 10 mm · 272 g |
| Språk | Engelska |