Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Manoj Sachdev Softcover reprint of hardcover 2nd ed. 2007 edition

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing
Price: 2159 SEK
Availability: OutOfStock
Author: Manoj Sachdev

Pris

SEK 2.159

Beställningsvara

Förväntad leverans 30 sep - 8 okt

Få avisering om nya utgåvor med Manoj Sachdev

Våra kunder säger:

Top-vurdering på Google Reviews, baseret på tusinder af anmeldelser.

14 dagars returrätt

Toppbetyg på Trustpilot

Lägg till din iMusic-önskelista

eller

Inte betygsatt ännu

Finns även som:

Inbunden Bok

2nd ed. 2007 edition

(2007) SEK 2.159

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing

Manoj Sachdev

Softcover reprint of hardcover 2nd ed. 2007 edition

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, black & white illustrations

Media	Böcker Pocketbok (Bok med mjukt omslag och limmad rygg)
Releasedatum	10 november 2010
ISBN13	9781441942852
Utgivare	Springer-Verlag New York Inc.
Antal sidor	328
Mått	155 × 235 × 18 mm · 494 g
Språk	Engelska