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VLSI Design and Test 1st ed. 2017 edition
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VLSI Design and Test
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.
815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.
| Media | Böcker Bok |
| Releasedatum | 22 december 2017 |
| ISBN13 | 9789811074691 |
| Utgivare | Springer Verlag, Singapore |
| Antal sidor | 815 |
| Mått | 150 × 220 × 20 mm · 1,25 kg |
| Redaktör | Dasgupta, Sudeb |
| Redaktör | Kaushik, Brajesh Kumar |
| Redaktör | Singh, Virendra |