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Bias Temperature Instability for Devices and Circuits Softcover reprint of the original 1st ed. 2014 edition
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Bias Temperature Instability for Devices and Circuits
Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
821 pages, 283 black & white illustrations, 318 colour illustrations, 22 black & white tables, biogr
| Media | Böcker Pocketbok (Bok med mjukt omslag och limmad rygg) |
| Releasedatum | 1 oktober 2016 |
| ISBN13 | 9781493955299 |
| Utgivare | Springer-Verlag New York Inc. |
| Antal sidor | 810 |
| Mått | 150 × 220 × 10 mm · 1,37 kg |
| Språk | Engelska |
| Redaktör | Grasser, Tibor |