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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Softcover reprint of the original 1st ed. 2000 edition
Gianfranco Pacchioni
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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Softcover reprint of the original 1st ed. 2000 edition
Gianfranco Pacchioni
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
624 pages, 87 black & white illustrations, biography
| Media | Böcker Pocketbok (Bok med mjukt omslag och limmad rygg) |
| Releasedatum | 31 december 2000 |
| ISBN13 | 9780792366867 |
| Utgivare | Springer |
| Antal sidor | 624 |
| Mått | 153 × 234 × 20 mm · 875 g |
| Språk | Engelska |
| Redaktör | Griscom, David L. |
| Redaktör | Pacchioni, Gianfranco |
| Redaktör | Skuja, Linards |
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