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Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
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Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
406 pages, 267 b/w illus. 3 tables
Media | Böcker Inbunden Bok (Inbunden bok med hårda pärmar och skyddsomslag) |
Releasedatum | 6 juli 2000 |
ISBN13 | 9780521554909 |
Utgivare | Cambridge University Press |
Antal sidor | 406 |
Mått | 170 × 244 × 24 mm · 1,13 kg |
Redaktör | Browning, Nigel D. (University of Illinois, Chicago) |
Redaktör | Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee) |
Se alt med Nigel D Browning ( t.ex. Pocketbok och Inbunden Bok )