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Reflection High-Energy Electron Diffraction
Ichimiya, Ayahiko (Nagoya University, Japan)
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SEK 829
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Reflection High-Energy Electron Diffraction
Ichimiya, Ayahiko (Nagoya University, Japan)
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.
366 pages, black & white illustrations
| Media | Böcker Pocketbok (Bok med mjukt omslag och limmad rygg) |
| Releasedatum | 17 februari 2011 |
| ISBN13 | 9780521184021 |
| Utgivare | Cambridge University Press |
| Antal sidor | 366 |
| Mått | 171 × 245 × 20 mm · 636 g |
| Språk | Engelska |
Se alt med Ichimiya, Ayahiko (Nagoya University, Japan) ( t.ex. Pocketbok och Inbunden Bok )