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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Softcover reprint of the original 1st ed. 2016 edition
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics
269 pages, 17 Tables, black and white; 67 Illustrations, color; 134 Illustrations, black and white;
| Media | Böcker Pocketbok (Bok med mjukt omslag och limmad rygg) |
| Releasedatum | 23 oktober 2016 |
| ISBN13 | 9788132234241 |
| Utgivare | Springer, India, Private Ltd |
| Antal sidor | 269 |
| Mått | 150 × 220 × 10 mm · 493 g |
| Redaktör | Mahapatra, Souvik |