Integrated Circuit Failure Analysis: A Guide to Preparation Techniques - Quality and Reliability Engineering Series - Beck, Friedrich (Siemens AG, Munich, Germany) - Böcker - John Wiley & Sons Inc - 9780471974017 - 19 januari 1998
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Integrated Circuit Failure Analysis: A Guide to Preparation Techniques - Quality and Reliability Engineering Series

Beck, Friedrich (Siemens AG, Munich, Germany)

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Integrated Circuit Failure Analysis: A Guide to Preparation Techniques - Quality and Reliability Engineering Series

The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right.


190 pages, index

Media Böcker     Inbunden Bok   (Inbunden bok med hårda pärmar och skyddsomslag)
Releasedatum 19 januari 1998
ISBN13 9780471974017
Utgivare John Wiley & Sons Inc
Antal sidor 190
Mått 237 × 159 × 16 mm   ·   396 g
Språk Engelska