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Built In Test for VLSI: Pseudorandom Techniques
Bardell, Paul H. (IBM Corporation, Armonk, NY)
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SEK 3.199
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Built In Test for VLSI: Pseudorandom Techniques
Bardell, Paul H. (IBM Corporation, Armonk, NY)
Presents the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. The intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students.
368 pages, Ill.
| Media | Böcker Inbunden Bok (Inbunden bok med hårda pärmar och skyddsomslag) |
| Releasedatum | 2 december 1987 |
| ISBN13 | 9780471624639 |
| Utgivare | John Wiley & Sons Inc |
| Antal sidor | 368 |
| Mått | 165 × 240 × 23 mm · 610 g |