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Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics
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Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics
232 pages
Media | Böcker Inbunden Bok (Inbunden bok med hårda pärmar och skyddsomslag) |
Releasedatum | 25 november 2024 |
ISBN13 | 9780443297861 |
Utgivare | Elsevier Science Publishing Co Inc |
Antal sidor | 232 |
Mått | 497 g (Estimerad vikt) |
Serieredaktör | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
Serieredaktör | Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) |